DocumentCode
1464769
Title
A novel waveguide-to-microstrip transition for millimeter-wave module applications
Author
Villegas, Frank J. ; Stones, D. Ian ; Hung, H. Alfred
Author_Institution
WaveBand, Torrance, CA, USA
Volume
47
Issue
1
fYear
1999
fDate
1/1/1999 12:00:00 AM
Firstpage
48
Lastpage
55
Abstract
A novel waveguide-to-microstrip transition is developed using a new design methodology based on iris coupling. Key features of the design are a single-layer substrate, new matching topology, and new cavity enclosure. The transition lends itself to a low-cost implementation, while maintaining the enclosure´s hermetic integrity. An extensive tolerance study shows that the present design is robust and very stable with respect to manufacturing and assembly variations. Careful consideration has been given to the mechanical aspects of the transition´s implementation in order to achieve seamless integration into the overall package manufacturing and assembly process without sacrificing electrical performance. Proof of concept was achieved by implementing a Q-band (f0=44.5 GHz) design on alumina, a W-band (f0=94 GHz) design on z-cut quartz, and a W-band design on fused silica. All exhibited better than 22 dB return loss at their center frequencies with less than 0.3 dB insertion loss, and at minimum a 10% 15 dB return-loss bandwidth
Keywords
MIMIC; alumina; cavity resonators; microstrip discontinuities; microstrip transitions; millimetre wave integrated circuits; modules; quartz; waveguide discontinuities; waveguide transitions; 0.3 dB; 22 dB; 44.5 GHz; 94 GHz; Al2O3; EHF; MM-wave module applications; Q-band design; SiO2; W-band design; alumina; cavity enclosure; design methodology; fused silica; hermetic integrity; insertion loss; iris coupling; low-cost implementation; matching topology; mechanical aspects; millimeter-wave module; return loss; single-layer substrate; tolerance study; waveguide-to-microstrip transition; z-cut quartz; Assembly; Design methodology; Iris; Manufacturing processes; Millimeter wave technology; Packaging; Robustness; Silicon compounds; Topology; Waveguide transitions;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/22.740075
Filename
740075
Link To Document