Title :
Electric field mapping system using an optical-fiber-based electrooptic probe
Author :
Yang, K. ; Katehi, Linda P B ; Whitaker, J.F.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
fDate :
4/1/2001 12:00:00 AM
Abstract :
A microwave electric-field mapping system based on electrooptic sampling has been developed using micromachined GaAs crystals mounted on gradient index lenses and single-mode optical fibers. The probes are able to detect three orthogonal polarizations of electric fields and, due to the flexibility and size of the optical fiber, can be positioned not only from the extreme near-field to the far-field regions of microwave and millimeter-wave structures, but also inside of enclosures such as waveguides and packages.
Keywords :
electric field measurement; electro-optical devices; fibre optic sensors; microwave measurement; millimetre wave measurement; probes; GaAs; MM-wave structures; electric-field mapping system; electrooptic sampling; enclosures; far-field radiation patterns; gradient index lenses; micromachined GaAs crystals; microwave structures; near-field radiation patterns; optical-fiber-based electrooptic probe; orthogonal polarizations detection; packages; single-mode optical fibers; waveguides; Crystals; Gallium arsenide; Lenses; Optical fiber polarization; Optical fibers; Optical waveguides; Packaging; Probes; Sampling methods; Ultraviolet sources;
Journal_Title :
Microwave and Wireless Components Letters, IEEE
DOI :
10.1109/7260.916331
