Title :
A variable frequency method for wide-band microwave material characterization
Author :
Mattar, K.E. ; Brodwin, M.E.
Author_Institution :
Dept. of Phys., Calgary Univ., Alta., Canada
fDate :
8/1/1990 12:00:00 AM
Abstract :
A variable reactance termination method for measurement of the complex permittivity spectra is described. The method uses modern frequency swept sources and is semi-automated. The frequency variable replaces mechanical tuning for improved measurements and optimization of sensitivity. Sources of errors are outlined, and range and limitations on conductivity are discussed. Results of measurements of Teflon and silicon are presented
Keywords :
microwave measurement; permittivity measurement; polymers; silicon; Si; Teflon; complex permittivity spectra; frequency swept sources; optimization of sensitivity; polymers; variable frequency method; variable reactance termination; wide-band microwave material characterization; Circuits; Coaxial components; Dielectric measurements; Frequency; Microwave measurements; Microwave theory and techniques; Optical reflection; Permittivity measurement; Tuning; Wideband;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
