DocumentCode :
1465581
Title :
A variable frequency method for wide-band microwave material characterization
Author :
Mattar, K.E. ; Brodwin, M.E.
Author_Institution :
Dept. of Phys., Calgary Univ., Alta., Canada
Volume :
39
Issue :
4
fYear :
1990
fDate :
8/1/1990 12:00:00 AM
Firstpage :
609
Lastpage :
614
Abstract :
A variable reactance termination method for measurement of the complex permittivity spectra is described. The method uses modern frequency swept sources and is semi-automated. The frequency variable replaces mechanical tuning for improved measurements and optimization of sensitivity. Sources of errors are outlined, and range and limitations on conductivity are discussed. Results of measurements of Teflon and silicon are presented
Keywords :
microwave measurement; permittivity measurement; polymers; silicon; Si; Teflon; complex permittivity spectra; frequency swept sources; optimization of sensitivity; polymers; variable frequency method; variable reactance termination; wide-band microwave material characterization; Circuits; Coaxial components; Dielectric measurements; Frequency; Microwave measurements; Microwave theory and techniques; Optical reflection; Permittivity measurement; Tuning; Wideband;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.57242
Filename :
57242
Link To Document :
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