DocumentCode :
1465953
Title :
An Allan variance real-time processing system for frequency stability measurements of semiconductor lasers
Author :
Kuboki, K. ; Ohtsu, M.
Author_Institution :
Graduate Sch. at Nagatsuta, Tokyo Inst. of Technol., Kanagawa, Japan
Volume :
39
Issue :
4
fYear :
1990
fDate :
8/1/1990 12:00:00 AM
Firstpage :
637
Lastpage :
641
Abstract :
A real-time frequency stability measurement system for semiconductor lasers was developed. Since the frequency of the input signal is measured successively without clearing the counter, measurements of the Allan variance made with this system are more accurate than those made with conventional instruments. The Allan variance can be measured for integration times τ from 1 μs to 10000 s, and the number N of measured frequencies averaged over the integration time τ can be arbitrarily selected up to N=707 for each integration time. The highest measurable frequency was 90 MHz. It was demonstrated experimentally that this system can be used for measurements of the frequency stability of semiconductor lasers
Keywords :
laser frequency stability; laser variables measurement; semiconductor junction lasers; signal processing; 1 mus to 10000 s; 90 MHz; Allan variance real-time processing; frequency stability measurements; integration times; semiconductor lasers; Counting circuits; Frequency locked loops; Frequency measurement; Instruments; Laser stability; Latches; Optical mixing; Real time systems; Semiconductor lasers; Time measurement;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.57247
Filename :
57247
Link To Document :
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