• DocumentCode
    1466166
  • Title

    Small-Signal Equivalent-Circuit Model and Characterization of 1.55-μm Buried Tunnel Junction Vertical-Cavity Surface-Emitting Lasers

  • Author

    Zhu, Ning Hua ; Xu, Gui Zhi ; Hofmann, Werner ; Chen, Wei ; Böhm, Gerhard ; Liu, Yu ; Wang, Xin ; Xie, Liang ; Amann, Markus-Christian

  • Author_Institution
    State Key Lab. on Integrated Optoelectron., Chinese Acad. of Sci. (CAS), Beijing, China
  • Volume
    58
  • Issue
    5
  • fYear
    2010
  • fDate
    5/1/2010 12:00:00 AM
  • Firstpage
    1283
  • Lastpage
    1289
  • Abstract
    An equivalent-circuit model for a novel 1.55- μm buried tunnel junction vertical-cavity surface-emitting laser chip is proposed based on the structure of the device. The values of the equivalent-circuit elements are determined by fitting the reflection and transmission coefficients at different bias currents. Good agreement between measured and simulated results implies the validity of the equivalent-circuit model. The influences of the buried tunnel junction, active region, and parasitic parameters on the high-frequency responses are investigated based on measurements and theoretical predictions. It is shown that the impedance of the device will change with the bias current, even if the bias current is above threshold, which is different from the edge-emitting laser, and the frequency responses depend on both the buried tunnel junction and mesa diameters.
  • Keywords
    S-parameters; equivalent circuits; molecular beam epitaxial growth; semiconductor lasers; surface emitting lasers; buried tunnel junction vertical-cavity surface-emitting lasers; optical modulation; scattering parameters; semiconductor lasers; small-signal equivalent-circuit model; Equivalent-circuit model; optical modulation; scattering parameters; semiconductor lasers; vertical-cavity surface-emitting lasers (VCSELs);
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2010.2045561
  • Filename
    5444925