DocumentCode :
1466180
Title :
Enhanced Flux Pinning in YBCO+YSZ Composite Films Grown by TFA-MOD Method
Author :
Ye, Shuai ; Suo, Hongli ; Liu, Min ; Tang, Xiao ; Wang, Rong ; Wu, Ziping ; Zhou, Meiling
Author_Institution :
Coll. of Mater. Sci. & Eng., Beijing Univ. of Technol., Beijing, China
Volume :
20
Issue :
3
fYear :
2010
fDate :
6/1/2010 12:00:00 AM
Firstpage :
1573
Lastpage :
1576
Abstract :
More attention was paid to the fact that columnar defects generated by introducing nano-particles into YBCO films can improve the in-field superconducting properties of YBCO as pinning centers. Epitaxial YBCO films with self-assembled Yttrium-stabilized Zirconia (YSZ) nano-particles have been successfully prepared by TFA-MOD based on different solutions and the effect of nano-particle dopants on the field properties of YBCO films was investigated by analyzing the results obtained by PPMS according to the Bean Model. The critical current densities (Jc) of YBCO films with YSZ nano-particle were found to be improved with respect to pure YBCO films in range of 0-5 T. The Jc value of YBCO film with YSZ dopant was 0.2 MA/cm2 at 50 K and 4 T field, which is 4 times higher than that of pure YBCO film. Furthermore, an optimized property was observed for YBCO films doped by 6 mol.% YSZ nano-particle shown by the dependence relationship between Jc value and field for YBCO films with different amount of YSZ dopants.
Keywords :
MOCVD; barium compounds; composite materials; critical current density (superconductivity); doping; flux pinning; high-temperature superconductors; nanoparticles; self-assembly; superconducting epitaxial layers; yttrium compounds; YBa2Cu3O7-x:Y2O3Zr2O3; bean model; columnar defects; composite films; critical current density; enhanced flux pinning; epitaxial films; metalorganic deposition; nanoparticle dopants; self-assembled yttrium-stabilized zirconia nanoparticles; Artificial pinning center; TFA-MOD; YBCO film; YSZ dopant;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2010.2044780
Filename :
5444927
Link To Document :
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