DocumentCode
1467532
Title
Circuit models and applications of the superconducting field-effect transistor
Author
Glasser, Lance A.
Author_Institution
Central Res. Lab., Hitachi Ltd., Tokyo, Japan
Volume
24
Issue
5
fYear
1989
fDate
10/1/1989 12:00:00 AM
Firstpage
1441
Lastpage
1450
Abstract
Static and dynamic models for the superconducting transistor are developed. The models capture the symmetry of the source-drain structure, incorporate the gate reaction, span the long- and short-channel regimes without discontinuity, and are suitable for circuit simulation. The sensitivity of the drain-to-source critical current to changes in gate charge is shown to control much of the device dynamics. The model is used to investigate several circuit configurations including amplifiers, inverters, latches, flux transfer devices, and phase-locked components.
Keywords
insulated gate field effect transistors; superconducting junction devices; 4.2 K; Si; amplifiers; applications; circuit configurations; circuit models; circuit simulation; device dynamics; drain-to-source critical current; dynamic models; flux transfer devices; gate charge; gate reaction; inverters; latches; long channel regime; phase-locked components; sensitivity; short-channel regimes; source-drain structure; static models; superconducting FET; superconducting field-effect transistor; superconducting transistor; symmetry; Circuit simulation; Critical current; Cryogenics; FETs; High temperature superconductors; Inverters; Latches; MOSFET circuits; Metallization; Superconducting materials; Threshold voltage; Wave functions;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.1989.572631
Filename
572631
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