Title :
Low-latency dynamic bandwidth allocation for 100 km long-reach EPONs
Author :
Murayama, D. ; Oota, Noriyuki ; Suzuki, Kenji ; Yoshimoto, Naoto
Author_Institution :
NTT Access Network Service Syst. Labs., Yokosuka, Japan
Abstract :
We propose a new dynamic bandwidth allocation (DBA) method for long-reach passive optical networks that can reduce the upstream latency. With this method, an optical line terminal allocates bandwidth to long-distance (up to 100 km) optical network units (ONUs) with a transmission request prediction and reduces the latency of the long-distance ONUs. This has no influence on the latency of short-distance ONUs even if they coexist with long-distance ONUs. The results of real machine experiments show that this new DBA method achieves a smaller latency with long-distance ONUs than the conventional DBA technique, and that there is no influence on short-distance ONUs. The latency time and jitter are kept below 1300 μs and 1000 μs, respectively, for both long- and short-distance ONUs. The experimental results also reveal the effect of the proposed method on bandwidth utilization efficiency and fairness. The degradation in bandwidth utilization efficiency when one long-distance ONU is added is small (0.3%), and the fairness index degradation is negligible (less than 0.1%), when the parameters are optimized. These results indicate the validity of the proposed DBA method.
Keywords :
bandwidth allocation; passive optical networks; DBA method; DBA technique; bandwidth utilization efficiency; bandwidth utilization fairness; distance 100 km; long-distance ONU; long-reach EPON; long-reach passive optical networks; low-latency dynamic bandwidth allocation; optical line terminal; transmission request prediction; Bandwidth; EPON; IEEE 802.3 Standards; Logic gates; Optical network units; Passive optical networks; Resource management; Dynamic bandwidth allocation; EthernetPON; Low latency; Optical access network; Time divisionmultiple access;
Journal_Title :
Optical Communications and Networking, IEEE/OSA Journal of
DOI :
10.1364/JOCN.5.000048