DocumentCode :
1468184
Title :
Determining mode excitations of vacuum electronics devices via three-dimensional simulations using the SOS code
Author :
Warren, Gary
Author_Institution :
Mission Res. Corp., Newington, VA, USA
Volume :
35
Issue :
11
fYear :
1988
fDate :
11/1/1988 12:00:00 AM
Firstpage :
2027
Lastpage :
2033
Abstract :
Examined the feasibility of determining via simulation the mode excitation behavior of vacuum electronic devices. The SOS code was used to compute the resonance modes (frequency-domain information) of sample devices and separately to compute the transient behavior of the same devices. Then a new code, DOT, to compute appropriate dot products of the time-domain and frequency-domain results and the transient behavior of individual modes in the device. Modes in a coupled-cavity traveling-wave tube (CCTWT) section excited with coaxial E-probes (cable stubs) and with an electron beam were analyzed in separate simulations. The authors examined whether the transient waves were forward or backward waves for each case. Finally, they computed the hot-test mode frequencies of the CCTWT section
Keywords :
electron beams; travelling-wave-tubes; vacuum tubes; SOS code; backward waves; coaxial E-probes; coupled-cavity traveling-wave tube; dot products; frequency-domain; frequency-domain information; hot-test mode frequencies; mode excitations; resonance modes; sample devices; three-dimensional simulations; time-domain; transient behavior; vacuum electronics devices; Analytical models; Coaxial cables; Computational modeling; Electron beams; Electron tubes; Frequency domain analysis; Optical coupling; Resonance; Time domain analysis; US Department of Transportation;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.7422
Filename :
7422
Link To Document :
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