Title :
Design and Fabrication of a Silicon Interposer With TSVs in Cavities for Three-Dimensional IC Packaging
Author :
Zhang, Rong ; Lo, Jeffery C C ; Lee, S. W Ricky
Author_Institution :
Electron. Packaging Lab., Hong Kong Univ. of Sci. & Technol., Kowloon, China
fDate :
6/1/2012 12:00:00 AM
Abstract :
Flip chip is one of the packaging techniques for high-performance components. There is a greater demand on integrating more functions in a smaller chip nowadays. This leads to the increase of I/O density. Organic substrate is the bottleneck of the high-density packaging. A silicon interposer with through-silicon vias (TSVs) is commonly used to provide a platform with a high wiring density to redistribute I/Os. After I/O redistribution, larger solder joints with a larger pitch can be used to connect the interposer to the organic substrate. In this paper, a TSV-based silicon interposer with a cavity and copper pillars for 3-D packaging is presented. The cavity hosts the flip-chip device. There are copper-filled TSVs in the cavity to provide the electrical interconnections to the backside of the interposer. Flip-chip solder bumps are electroplated on the copper pillars. Subsequent to the flip-chip assembly process, the device is seated in the cavity entirely. The backside of the flip chip is lower than that of the surface of the interposer. This provides a better environment for further die stacking on the surface of the interposer. The microfabrication process of the proposed silicon interposer with TSVs in cavities is discussed in detail.
Keywords :
integrated circuit interconnections; integrated circuit packaging; silicon; solders; three-dimensional integrated circuits; I/O density; I/O redistribution; TSV-based silicon interposer; cavities; copper pillars; electrical interconnections; flip-chip assembly process; flip-chip solder bump; high wiring density; high-density packaging; high-performance components; organic substrate; silicon interposer fabrication; solder joints; three-dimensional IC packaging technique; through-silicon via; Cavity resonators; Copper; Etching; Flip chip; Packaging; Silicon; Three dimensional displays; 3-D packaging; Cavities; interposer; through-silicon via (TSV);
Journal_Title :
Device and Materials Reliability, IEEE Transactions on
DOI :
10.1109/TDMR.2012.2190764