DocumentCode
1470166
Title
ATPRG: an automatic test program generator using HDL-A for fault diagnosis of analog/mixed-signal integrated circuits
Author
Huang, Wei-Hsing ; Wey, Chin-Long
Author_Institution
Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI, USA
Volume
47
Issue
2
fYear
1998
fDate
4/1/1998 12:00:00 AM
Firstpage
426
Lastpage
431
Abstract
HDL-A is an analog version of the Hardware Description Language which is suitable for structural and behavioral descriptions and simulations of digital, analog, and mixed-signal circuits and systems. This paper presents an automatic test program generator (ATPRG) for fault diagnosis of analog/mixed-signal integrated circuits. The ATPRG is developed under the Mentor Graphics Design system environment, where the units under test (UUT´s) are modeled in HDL-A and simulated by Accusim, and AMPLE (Advanced Multi-Purpose Language) in Mentor Graphics Design system environment is used to define and execute the generation process automatically. To increase the reliability and quality, the generated test programs will be verified and validated. A verification process checks if the test programs are generated correctly and if the generated test programs can effectively locate fault(s). The test programs are validated by emulating the UUT´s. The actual test can be run in a fully automatic mode, or interactively
Keywords
analogue integrated circuits; automatic test pattern generation; fault diagnosis; hardware description languages; integrated circuit testing; mixed analogue-digital integrated circuits; AMPLE; ATPRG; Accusim; HDL-A; Mentor Graphics Design system environment; UUT; advanced multi-purpose language; analog integrated circuits; automatic test program generator; behavioral descriptions; fault diagnosis; fully automatic mode; mixed-signal integrated circuits; structural descriptions; verification process; Automatic programming; Automatic testing; Circuit faults; Circuit simulation; Circuit testing; Circuits and systems; Fault diagnosis; Graphics; Hardware design languages; Integrated circuit testing;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/19.744186
Filename
744186
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