Advanced processing techniques of high-voltage impulse test signals

Author

Angrisani, Leopoldo ; Daponte, Pasquale ; Dias, Custódio ; Do Vale, A. Almeida

Author_Institution

Dept. of Comput. Sci. & Electr. Eng., Salerno Univ., Italy

Volume

47

Issue

2

fYear

1998

fDate

4/1/1998 12:00:00 AM

Firstpage

439

Lastpage

445

Abstract

Automated analysis and processing of the digital records obtained in high-voltage (HV) impulse tests requires special techniques that are able to detect and characterize all sorts of disturbances (of short and long duration) in all waveform types (full, chopped, and sliced). Especially for the cases where a short-duration disturbance has to be removed before the evaluation of the impulse parameters, it is important to characterize the disturbance both in time and frequency. This paper describes a new technique based on the wavelet transform used for this purpose. Experimental results show the technique´s reliability when applied to actual HV impulses

Keywords

impulse testing; signal resolution; wavelet transforms; chopped waveforms; full waveforms; high-voltage impulse test signals; impulse parameters; processing techniques; reliability; short-duration disturbance; sliced waveforms; waveform disturbances; wavelet transform; Automatic testing; Capacitance; Circuit noise; Circuit testing; Continuous wavelet transforms; Discrete wavelet transforms; Frequency; Impulse testing; Shape measurement; Signal processing;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.744188

Filename

744188