Title :
Capacitive coupling of floating body well to sensitive nodes prevents high-resistance CMOS circuit from latching-up
Author :
Bafleur, M. ; Buxo, J. ; Elmoznine, A. ; Rossel, P.
Author_Institution :
LAAS du CNRS, Toulouse, France
fDate :
6/22/1989 12:00:00 AM
Abstract :
A new concept is derived whereby voltage transients occurring in the bulk substrate of a floating p--well CMOS circuit can be conveniently decoupled near the sensitive n+/p- source-well parasitic junctions of n-channel transistors, thereby preventing latch-up occurrence. The ability of the well body to accommodate a nonequipotential situation is then taken advantage of to design a new and compact filter circuit that would certainly trigger latch-up if implemented on a grounded p--well.
Keywords :
CMOS integrated circuits; integrated circuit technology; semiconductor device models; CMOS latch-up prevention; capacitive coupling; compact filter circuit; floating body well; floating well; high-resistance CMOS circuit; latchupfree circuits; voltage transients decoupling;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19890579