Title :
A Real-Time Synchronous Detector for the TAE Antenna Diagnostic at JET
Author :
Alves, D. ; Coelho, R. ; Klein, A. ; Panis, T. ; Murari, A.
Author_Institution :
Inst. de Plasmas e Fusao Nucl., Associacao EURATOM/IST, Lisbon, Portugal
fDate :
4/1/2010 12:00:00 AM
Abstract :
Routine studies are performed on JET using a new set of antennas to excite Toroidal Alfve¿n Eigenmodes (TAE). A TAE resonance footprint is observed in the plasma response measurement when there is a noticeable variation in both the amplitude and the phase of the response with respect to the excitation. An algorithm for real-time identification of TAE resonances, based on a hardware lock-in amplifier, is presently used at the Joint European Torus (JET) tokamak for detecting such variations. In this paper, we revisit the problem of estimating the I-Q characteristics from a known non-stationary frequency mode, with a resonant-like phase response, embedded in a digital signal. A non-stationary linear model is used in a recursive filter implementation of a lock-in amplifier. We propose it as a viable alternative to hardware synchronous detectors such as the one in use at the JET and compare its´ performance with standard digital lock-in techniques in terms of bandwidth and phase response under high throughput rates requirements.
Keywords :
Tokamak devices; antennas in plasma; plasma diagnostics; plasma toroidal confinement; antenna diagnostic; hardware lock-in amplifier; hardware synchronous detectors; i-q characteristics; joint European torus tokamak; nonstationary frequency mode; nonstationary linear model; plasma response measurement; real-time synchronous detector; recursive filter implementation; resonant-like phase response; toroidal Alfven eigenmodes resonances; Amplifiers; Antenna measurements; Detectors; Frequency estimation; Hardware; Phase measurement; Plasma diagnostics; Plasma measurements; Resonance; Tokamaks; Diagnostics; estimation; plasma measurements; real time systems; signal processing;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2009.2033679