Title :
Novel MMIC source-impedance tuners for on-wafer microwave noise-parameter measurements
Author :
McIntosh, Caroline E. ; Pollard, Roger D. ; Miles, Robert E.
Author_Institution :
Sch. of Electron. & Electr. Eng., Leeds Univ., UK
fDate :
2/1/1999 12:00:00 AM
Abstract :
Novel monolithic-microwave integrated-circuit source-impedance tuners for use in on-wafer noise-parameter measurement systems are reported, which can be incorporated into a wafer probe tip. These eliminate the effect of cable and probe losses on the magnitude of a reflection coefficient that can be presented to the input of an on-wafer test device, thus enabling higher magnitudes to be synthesized than for conventional tuners, and with the potential of increasing noise-parameter measurement accuracy
Keywords :
HEMT integrated circuits; MMIC phase shifters; circuit tuning; electric noise measurement; field effect MMIC; field effect transistor switches; microwave reflectometry; network analysers; MMIC source-impedance tuners; PHEMT switches; Smith chart; noise-parameter measurement accuracy; on-wafer microwave noise-parameter measurement; on-wafer test device input; reflection coefficient; two-port parameters; variable impedance state; wafer probe tip; Impedance; Integrated circuit noise; Loss measurement; MMICs; Microwave measurements; Noise measurement; PHEMTs; Probes; Switches; Tuners;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
