DocumentCode :
1470786
Title :
Experimental characterization of a dynamically gain-flattened erbium-doped fiber amplifier
Author :
Lee, Y.W. ; Nilsson, J. ; Hwang, S.T. ; Kim, S.J.
Author_Institution :
Telecommun. R&D Center, Samsung Electron. Co., Suwon, South Korea
Volume :
8
Issue :
12
fYear :
1996
Firstpage :
1612
Lastpage :
1614
Abstract :
We have designed and experimentally characterized an erbium doped fiber amplifier (EDFA) which possesses a wavelength-independent gain spectrum, independent of the operating level of the gain (dynamic gain flatness), and without requiring any gain-level-dependent control of any parameters. In the wavelength range 1542-1552 nm, the gain was flat to within the experimental uncertainties of /spl plusmn/0.3 dB even as the gain level changed by 17 dB. The EDFA was based on a low-Al-content alumino-germanosilicate EDF and a Mach-Zehnder filter. We believe that this type of EDFA, which has not been demonstrated before, can significantly simplify the design of amplified wavelength-division multiplexing (WDM) transmission systems and increase the robustness of long-distance WDM transmission.
Keywords :
erbium; fibre lasers; infrared sources; laser transitions; measurement errors; optical communication equipment; optical fibre communication; optical filters; wavelength division multiplexing; 1542 to 1552 nm; Mach-Zehnder filter; amplified wavelength-division multiplexing transmission system design; dynamic gain flatness; dynamically gain-flattened erbium-doped fiber amplifier; erbium doped fiber amplifier design; experimental uncertainties; gain level; gain-level-dependent control; long-distance WDM transmission robustness; low-Al-content alumino-germanosilicate EDF; operating level; wavelength range; wavelength-independent gain spectrum; Erbium-doped fiber amplifier; Extinction ratio; Filters; Gain measurement; Optical attenuators; Probes; Research and development; Shape; Wavelength division multiplexing; Wavelength measurement;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/68.544694
Filename :
544694
Link To Document :
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