Title :
Cryogenic sapphire oscillator with exceptionally high frequency stability
Author :
Mann, Anthony G. ; Sheng, Chang ; Luiten, Andre N.
Author_Institution :
Dept. of Phys., Western Australia Univ., Nedlands, WA, Australia
fDate :
4/1/2001 12:00:00 AM
Abstract :
Extremely high short-term frequency stability has been realized in microwave oscillators based on liquid-helium-cooled sapphire dielectric resonators with a modified mounting structure. These oscillators have exhibited an Allan deviation of about 5.4×10-16τ -1/2 for integration times (τ) of 1 to 4 s and a minimum of 2.4×10-16 at 32 s. For integration times longer than 100 s, the frequency stability is approximately 3×10-17τ1/2, and the relative drift per day is about 10-13. This stability is the best reported to date for any microwave source over integration times less than 100 s
Keywords :
cryogenic electronics; dielectric resonator oscillators; frequency stability; microwave oscillators; phase noise; sapphire; Al2O3; cryogenic sapphire oscillator; extremely high short-term stability; high frequency stability; integration times; liquid-helium-cooled resonators; microwave oscillators; microwave source; modified mounting structure; sapphire dielectric resonators; Atomic clocks; Clamps; Cryogenics; Dielectric liquids; Frequency measurement; Microwave oscillators; Phase noise; Resonant frequency; Stability; Temperature;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
