DocumentCode
1472353
Title
ERSA: Error Resilient System Architecture for Probabilistic Applications
Author
Cho, Hyungmin ; Leem, Larkhoon ; Mitra, Subhasish
Author_Institution
Dept. of Electr. Eng., Stanford Univ., Stanford, CA, USA
Volume
31
Issue
4
fYear
2012
fDate
4/1/2012 12:00:00 AM
Firstpage
546
Lastpage
558
Abstract
There is a growing concern about the increasing vulnerability of future computing systems to errors in the underlying hardware. Traditional redundancy techniques are expensive for designing energy-efficient systems that are resilient to high error rates. We present Error Resilient System Architecture (ERSA), a robust system architecture which targets emerging killer applications such as recognition, mining, and synthesis (RMS) with inherent error resilience, and ensures high degrees of resilience at low cost. Using the concept of configurable reliability, ERSA may also be adapted for general-purpose applications that are less resilient to errors (but at higher costs). While resilience of RMS applications to errors in low-order bits of data is well-known, execution of such applications on error-prone hardware significantly degrades output quality (due to high-order bit errors and crashes). ERSA achieves high error resilience to high-order bit errors and control flow errors (in addition to low-order bit errors) using a judicious combination of the following key ideas: 1) asymmetric reliability in many-core architectures; 2) error-resilient algorithms at the core of probabilistic applications; and 3) intelligent software optimizations. Error injection experiments on a multicore ERSA hardware prototype demonstrate that, even at very high error rates of 20 errors/flip-flop/108 cycles (equivalent to 25000 errors/core/s), ERSA maintains 90% or better accuracy of output results, together with minimal impact on execution time, for probabilistic applications such as K-Means clustering, LDPC decoding, and Bayesian network inference. In addition, we demonstrate the effectiveness of ERSA in tolerating high rates of static memory errors that are characteristic of emerging challenges related to SRAM Vccmin problems and erratic bit errors.
Keywords
SRAM chips; integrated circuit reliability; probability; Bayesian network inference; ERSA; LDPC decoding; SRAM; asymmetric reliability; configurable reliability; control flow errors; error injection; error resilient system architecture algorithm; high-order bit errors; intelligent software optimizations; k-means clustering; many-core architectures; multicore ERSA hardware prototype; redundancy techniques; robust system architecture; static memory errors; Computer architecture; Hardware; Instruction sets; Probabilistic logic; Reliability engineering; Resilience; Error resilience; hardware errors; probabilistic applications; reliability; robust systems;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.2011.2179038
Filename
6171059
Link To Document