• DocumentCode
    1472787
  • Title

    Corrugation-Induced SiO _{2} Planar Long-Period Gratings for Photonic Applications

  • Author

    Jiang, Jia ; Callender, Claire L. ; Ledderhof, Christopher J.

  • Author_Institution
    Commun. Res. Centre Canada, Ottawa, ON, Canada
  • Volume
    22
  • Issue
    13
  • fYear
    2010
  • fDate
    7/1/2010 12:00:00 AM
  • Firstpage
    951
  • Lastpage
    953
  • Abstract
    A long-period grating based on silica planar lightwave circuit technology is reported. The grating structure has been realized by forming a periodic corrugation on the lower waveguide cladding layer. This structure offers a permanent refractive index modulation, resulting in a grating that is highly stable to environmental variation. A strong rejection band is observed at a specified resonance wavelength. Device sensitivity to external refractive index change of up to 2.9 × 10-6/pm can be achieved without any surface modification. Thermal characterization has demonstrated a temperature dependence of only 24.5 pm/°C .
  • Keywords
    claddings; diffraction gratings; optical planar waveguides; refractive index; silicon compounds; SiO2; cladding layer; periodic corrugation; planar long-period gratings; refractive index modulation; rejection band; silica planar lightwave circuit technology; Long-period grating (LPG); resonant wavelength; silica; waveguide;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2010.2048019
  • Filename
    5447772
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1472787