Title :
A microprocessor-based dual slope phase meter
Author :
Mahmud, S.M. ; Rusek, Andrzej ; Ganesan, Subramaniam
Author_Institution :
Sch. of Eng. & Comput. Sci., Oakland Univ., Rochester, MI, USA
fDate :
9/1/1988 12:00:00 AM
Abstract :
A dual-slope phase meter has been designed and tested to investigate its limitations. The design does not require a time standard; it offers good resolution, relative simplicity, low sensitivity to changes of internal circuit parameters, and microprocessor compatibility. The idea is based on a single-slope approach demonstrated by W.T. Davis (1986), but several disadvantages of the system have been eliminated. The main problem with the system, relating to the error due to the finite time of sampling, is discussed
Keywords :
computerised instrumentation; measurement errors; microcomputer applications; phase meters; computerised instrumentation; dual slope phase meter; error; finite time of sampling; microprocessor compatibility; Capacitors; Circuit testing; Frequency; Helium; Instruments; Measurement standards; Microprocessors; Signal generators; Time measurement; Voltage;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
