• DocumentCode
    1473294
  • Title

    Number and density of states in quantum semiconductor structures

  • Author

    Guthrie, Daniel K. ; Gaylord, Thomas K. ; Glytsis, Elias N.

  • Author_Institution
    Microelectron. Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA
  • Volume
    39
  • Issue
    4
  • fYear
    1996
  • fDate
    11/1/1996 12:00:00 AM
  • Firstpage
    465
  • Lastpage
    470
  • Abstract
    Pushed by the semiconductor industry to achieve greater speed and functionality, device dimensions are becoming sufficiently small to exhibit prominent quantum mechanical effects. In addition, devices are now being developed that utilize these quantum effects. The number and density of states are fundamentally important in the operation of any quantum device. Traditionally in a classroom setting, one-dimensional (1-D), two-dimensional (2-D), and three-dimensional (3-D) continuum approximations are presented to analyze the quantum wire, well, and box, respectively. As shown in this paper, the exact number and density of states can be straightforwardly calculated by students for real semiconductor quantum structures. These results clearly illustrate the overall true 3-D form of each of these structures. These correct calculations also reveal an overestimation in the number of states when using the continuum approximations
  • Keywords
    approximation theory; electronic density of states; electronic engineering education; semiconductor device models; semiconductor quantum dots; semiconductor quantum wells; semiconductor quantum wires; classroom; continuum approximations; device dimensions; electronics education; quantum box; quantum semiconductor structures; quantum well; quantum wire; state density; state number; students; Electrons; Molecular beam epitaxial growth; Optical filters; Optical refraction; Potential well; Quantum dots; Quantum mechanics; Semiconductor devices; Two dimensional displays; Wire;
  • fLanguage
    English
  • Journal_Title
    Education, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9359
  • Type

    jour

  • DOI
    10.1109/13.544799
  • Filename
    544799