DocumentCode
1473312
Title
Linear Time-Variant Modeling and Analysis of All-Digital Phase-Locked Loops
Author
Syllaios, Ioannis L. ; Balsara, Poras T.
Author_Institution
Dept. of Electr. Eng., Univ. of Texas at Dallas, Richardson, TX, USA
Volume
59
Issue
11
fYear
2012
Firstpage
2495
Lastpage
2506
Abstract
All-digital phase-locked loops (ADPLL) are inherently multirate systems with time-varying behavior. In support of this statement linear time-variant (LTV) models of ADPLL are presented that capture spectral aliasing effects that are not captured by linear time-invariant (LTI) models. It is analytically shown that the latter are subset of the former. The high-speed ΣΔ modulator that improves the frequency resolution of the digitally-controlled oscillator (DCO) is included, too. It realizes fractional resampling and interpolation of the tuning data of the DCO. The noise transfer from all three operating clock domains of the ADPLL (reference, ΣΔ, and DCO) to its output phase is accurately predicted and design metrics are derived with regard to its folded close-in and far-out phase noise performance. The analytical results are validated via simulations using measured event-driven modeling techniques for a CMOS RF ADPLL.
Keywords
CMOS integrated circuits; digital phase locked loops; interpolation; oscillators; sigma-delta modulation; CMOS RF ADPLL; DCO tuning data; LTI models; LTV models; all-digital phase-locked loop analysis; digitally-controlled oscillator; far-out phase noise performance; fractional resampling; frequency resolution; high-speed ΣΔ modulator; interpolation; linear time-variant model; linear time-variant modeling; measured event-driven modeling techniques; multirate systems; noise transfer; spectral aliasing effects; time-varying behavior; Analytical models; Clocks; Modulation; Phase locked loops; Phase noise; Transfer functions; All-digital phase-locked loops (ADPLL); frequency synthesizers; jitter transfer; linear time-variant (LTV) analysis; multirate modeling; noise folding; phase noise transfer; resampling; sigma-delta modulation; time-domain simulation;
fLanguage
English
Journal_Title
Circuits and Systems I: Regular Papers, IEEE Transactions on
Publisher
ieee
ISSN
1549-8328
Type
jour
DOI
10.1109/TCSI.2012.2189061
Filename
6171885
Link To Document