Parameter extraction and electrical characterization of high density connector using time domain measurements

Author

Pannala, Sreemala ; Haridass, Anand ; Swaminathan, Madhavan

Author_Institution

Packaging Res. Center, Georgia Inst. of Technol., Atlanta, GA, USA

Volume

22

Issue

1

fYear

1999

fDate

2/1/1999 12:00:00 AM

Firstpage

32

Lastpage

39

Abstract

Two coupled connector pins can be represented by an equivalent circuit consisting of six parameters, namely, self capacitance/self inductance per pin, mutual capacitance between pins and mutual inductance between pins. A systematic parameter extraction algorithm has been discussed in this paper using time domain reflectometry (TDR) measurements. This method uses a combination of stand-alone, common mode, and differential mode measurements to extract the connector parasitics. The accuracy of the equivalent circuit has been studied in detail using crosstalk measurements

Keywords

crosstalk; electric connectors; equivalent circuits; parameter estimation; time-domain reflectometry; common mode measurements; connector parasitics; coupled connector pins; crosstalk measurements; differential mode measurements; electrical characterization; equivalent circuit; high density connector; mutual capacitance; mutual inductance; parameter extraction; self capacitance; self inductance; time domain measurements; time domain reflectometry; Connectors; Coupling circuits; Equivalent circuits; Inductance; Mutual coupling; Parameter extraction; Parasitic capacitance; Pins; Reflectometry; Time measurement;

fLanguage

English

Journal_Title

Advanced Packaging, IEEE Transactions on

Publisher

ieee

ISSN

1521-3323

Type

jour

DOI

10.1109/6040.746540

Filename

746540