• DocumentCode
    14742
  • Title

    Quality Control of Vertically Aligned Carbon Nanotubes Grown by Chemical Vapor Deposition

  • Author

    Yagang Yao ; Zhuo Li ; Ching-Ping Wong

  • Author_Institution
    Inst. of Nanotech & Nanobionics, Suzhou, China
  • Volume
    3
  • Issue
    11
  • fYear
    2013
  • fDate
    Nov. 2013
  • Firstpage
    1804
  • Lastpage
    1810
  • Abstract
    Vertically aligned carbon nanotube (VACNT) has been proposed as a promising material for electrical interconnection and heat dissipation, because of its high electrical and thermal conductivity. Defects and impurities in synthesized VACNT, however, lead to unsatisfactory performance in these applications. To improve the quality of VACNT, we systematically studied the effects of various growth parameters on the quality of VACNT, including growth temperature, the amount of water vapor, carbon source, and hydrogen gas. By tailoring these parameters, we successfully synthesized high-quality VACNTs that were confirmed by Raman spectroscopy and thermogravimetric analysis. These findings might be helpful for the applications of VACNT in many fields. VACNT-based thermal interface material was successfully made and a low thermal resistance of ~9.0 mm2KW-1 suggests VACNTs´ promising potentials in current demanding thermal management.
  • Keywords
    Raman spectra; carbon nanotubes; chemical vapour deposition; quality control; thermal analysis; thermal resistance; Raman spectroscopy; VACNT; carbon source; chemical vapor deposition; growth temperature; hydrogen gas; quality control; thermal interface material; thermal resistance; thermogravimetric analysis; vertically aligned carbon nanotubes; water vapor; Carbon; Silicon; Substrates; Temperature; Thermal resistance; Chemical vapor deposition (CVD); high quality; low thermal resistance; vertically aligned carbon nanotubes (VACNTs);
  • fLanguage
    English
  • Journal_Title
    Components, Packaging and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    2156-3950
  • Type

    jour

  • DOI
    10.1109/TCPMT.2013.2278174
  • Filename
    6603278