DocumentCode :
1474626
Title :
Shot Noise in Single-Electron Tunneling Systems: A Semiclassical Model
Author :
Babiker, S.
Author_Institution :
Dept. of Electron. & Electr. Eng., Univ. of Khartoum, Khartoum, Sudan
Volume :
10
Issue :
5
fYear :
2011
Firstpage :
1191
Lastpage :
1195
Abstract :
In this paper, shot noise in single-electron tunneling circuits is studied using a semiclassical approach based on the master equation formalism where the transport through the circuit is modeled as sets of sequential stationary Poisson processes. Analytical expressions for the distribution of time between tunnel events and the resulting power spectral density S(f) are derived. The model is then used to investigate the correlated transfer of electrons and fluctuations in homogeneous long arrays of tunnel junctions.
Keywords :
master equation; shot noise; single electron devices; tunnelling; master equation formalism; power spectral density; semiclassical model; sequential stationary Poisson process; shot noise; single-electron tunneling circuit; Fluctuations; Integrated circuit modeling; Junctions; Mathematical model; Noise; Quantum dots; Tunneling; Quantum dots; shot noise; tunneling;
fLanguage :
English
Journal_Title :
Nanotechnology, IEEE Transactions on
Publisher :
ieee
ISSN :
1536-125X
Type :
jour
DOI :
10.1109/TNANO.2011.2127484
Filename :
5733425
Link To Document :
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