DocumentCode :
1474818
Title :
A general approach for determining the switching probability in rapid single flux quantum logic circuits
Author :
Ortlepp, Thomas ; Toepfer, Hannes ; Uhlmann, Hermann F.
Author_Institution :
Dept. of Fundamentals & Theory of Electr. Eng., Univ. of Technol. Ilmenau, Ilmenau, Germany
Volume :
11
Issue :
1
fYear :
2001
fDate :
3/1/2001 12:00:00 AM
Firstpage :
280
Lastpage :
283
Abstract :
A major restriction in the development of a working Rapid Single Flux Quantum (RSFQ) logic circuit with high-Tc superconductors is given by the influence of thermal noise. This gives reason to ask for a general determination of the digital bit error rate. As other approaches, our method of calculating the switching probability is based on the Fokker-Planck equation. In the past few years the bit error rates for a single Josephson junction, SQUIDs and the comparator were calculated by using this theory. We demonstrate numerical solution of the multidimensional Fokker-Planck equation to calculate bit error rates due to thermal noise for a Toggle Flip Flop circuit. In the present work, we combine thermal noise analysis with the effects of process variations in order to derive rules for designing high-Tc RSFQ logic circuits
Keywords :
Fokker-Planck equation; flip-flops; high-temperature superconductors; superconducting device noise; superconducting logic circuits; thermal noise; Josephson junction; RSFQ logic circuit; digital bit error rate; high-Tc superconductor; multidimensional Fokker-Planck equation; switching probability; thermal noise; toggle flip-flop; Bit error rate; Circuit noise; Equations; High temperature superconductors; Josephson junctions; Logic circuits; Multidimensional systems; Probability; SQUIDs; Superconducting device noise;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.919338
Filename :
919338
Link To Document :
بازگشت