• DocumentCode
    1474907
  • Title

    Investigation of Optical Power Tolerance for MEMS Mirrors

  • Author

    Knoernschild, Caleb ; Kim, Changsoon ; Gregory, Christopher W. ; Lu, Felix P. ; Kim, Jungsang

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA
  • Volume
    19
  • Issue
    3
  • fYear
    2010
  • fDate
    6/1/2010 12:00:00 AM
  • Firstpage
    640
  • Lastpage
    646
  • Abstract
    Optical power tolerance on micromirrors is a critical aspect of many high-power optical systems. Absorptive heating can negatively impact the performance of an optical system by altering the micromirror´s curvature during operation. This can lead to shifts in the beam waist locations or imaging planes within a system. This paper describes a scheme to measure the impact of mirror heating by optical power and determine the power tolerances of micromirrors with gold and aluminum coatings using a 532-nm laser. Results are compared with an analytical model of thermally induced stress and optical absorptive heating. Experimental data shows that gold-coated mirrors are able to handle 40 mW of optical power with a beam waist displacement of less than 20% of the output Rayleigh length, while aluminum-coated mirrors can tolerate 125 mW. Measured data along with modeling suggest that, with proper metal coating, optical powers greater than 1 W should not adversely affect the system performance.
  • Keywords
    aluminium; gold; heating; micro-optomechanical devices; micromirrors; optical films; Al; Au; MEMS mirrors; Rayleigh length; aluminum coatings; beam waist displacement; gold coatings; metal coating; micromirrors; mirror heating; optical absorptive heating; optical power tolerance; power 40 mW; thermally induced stress; wavelength 532 nm; Elastic deformation; heating; micromirrors; optical microelectromechanical devices; optical power;
  • fLanguage
    English
  • Journal_Title
    Microelectromechanical Systems, Journal of
  • Publisher
    ieee
  • ISSN
    1057-7157
  • Type

    jour

  • DOI
    10.1109/JMEMS.2010.2045736
  • Filename
    5451113