DocumentCode
1474920
Title
Fault-tolerant design of analogic CNN templates and algorithms-Part I: The binary output case
Author
Földesy, Péter ; Kék, L. ; Zarándy, Ákos ; Roska, Tamás ; Bártfai, G.
Author_Institution
Analogical & Neural Comput. Lab., Hungarian Acad. of Sci., Budapest, Hungary
Volume
46
Issue
2
fYear
1999
fDate
2/1/1999 12:00:00 AM
Firstpage
312
Lastpage
322
Abstract
This paper addresses the issue of designing a class of fault-tolerant cellular neural network (CNN) templates that, combined with CNN analogic algorithms, work correctly and reliably on given CNN universal machine (CNN-UM) chips. In particular, a generic method for finding nonpropagating binary-output CNN templates is proposed. This method is based on measurements of actual CNN-UM chips and combines adaptive optimization and decomposition of theoretically ideal CNN templates in order to correct the erroneous behavior of actual CNN-UM chips, which is mainly caused by imperfections introduced during fabrication. More specifically, the entire array of cells in a CNN-UM chip is modeled by a single feed-forward virtual cell whose optimal parameters are found by a simple and effective gradient-based method. In the case of binary input-output uncoupled templates (or Boolean operators), a systematic template decomposition method is applied whenever optimization fails to find a correctly working CNN template for all possible combinations of local 3×3 binary input patterns. The resulting templates are finally combined, yielding a simple CNN analogic algorithm. Examples are presented for both binary- and analog-input operators, using two concrete stored-program CNN-UM chips to demonstrate the effectiveness of the proposed method, whose advantages and limitations are also discussed
Keywords
cellular neural nets; fault tolerant computing; optimisation; Boolean operator; CNN-UM chip; adaptive optimization; algorithm; analogic CNN template; binary output; cellular neural network; decomposition; fault tolerant design; feedforward virtual cell; gradient method; universal machine; Algorithm design and analysis; Cellular neural networks; Computational modeling; Computer aided software engineering; Fault tolerance; Libraries; Optimization methods; Robustness; Semiconductor device measurement; Turing machines;
fLanguage
English
Journal_Title
Circuits and Systems I: Fundamental Theory and Applications, IEEE Transactions on
Publisher
ieee
ISSN
1057-7122
Type
jour
DOI
10.1109/81.747209
Filename
747209
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