Title :
Analysis of a shielded microstrip line with finite metallization thickness by the boundary element method
Author_Institution :
Dept. of Electr. Eng., Tatung Inst. of Technol., Taipei, Taiwan
Abstract :
A boundary element method is presented for the quasi-static analysis of a shielded microstrip line with finite metallization thickness. The analysis is based on the solution of a system of boundary integral equations which are derived from Green´s second identity. Numerical results for the charge distribution along the strip and the effects of metallization thickness on line characteristics are presented. The results show good agreement with data available in the literature.<>
Keywords :
boundary-elements methods; metallisation; shielding; strip lines; waveguide theory; Green´s second identity; boundary element method; charge distribution; finite metallization thickness; metallization thickness; quasi-static analysis; shielded microstrip line; waveguide theory; Boundary element methods; Conductors; Dielectric losses; Electrostatics; Frequency; Integral equations; Metallization; Microstrip; Strips; Transmission line matrix methods;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
