Noise and energy resolution of X-ray microcalorimeters

Author

de Korte, P.A.J. ; Bergmann Tiest, W.M. ; Bruijn, M.P. ; Hoevers, H.F.C. ; van der Kuur, J. ; Mels, W.A. ; Ridder, M.

Author_Institution

Space Res. Organ., Utrecht, Netherlands

Volume

11

Issue

1

fYear

2001

fDate

3/1/2001 12:00:00 AM

Firstpage

747

Lastpage

750

Abstract

Two type of sensor geometries of voltage-biased X-ray microcalorimeters with a phase-transition thermometer have been built and tested. Both devices show, in addition to the well-known noise sources of thermal fluctuation noise or phonon noise from the heatlink to the bath and Johnson noise from the thermometer resistance, also thermal fluctuation noise from the thermometer itself. In both cases however the measured energy resolution is limited by other sources. The energy resolution of the asymmetric lateral type of sensor, 12 to 15 eV to the bath. The energy resolution of the symmetric lateral sensor, 6.8+/-0.3 eV FWHM @ 5.9 keV, is limited by excess noise at frequencies below 1000 Hz. The origin of this noise component is unknown so far

Keywords

X-ray detection; particle calorimetry; superconducting device noise; superconducting particle detectors; thermal noise; 12 to 15 eV; 5.9 keV; X-ray microcalorimeters; energy resolution; noise resolution; phase-transition thermometer; phonon noise; sensor geometries; thermal fluctuation noise; Electrical resistance measurement; Energy resolution; Fluctuations; Geometry; Phonons; Resistance heating; Testing; Thermal resistance; Thermal sensors; Voltage;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.919453

Filename

919453