On-chip analog signal generation for mixed-signal built-in self-test

Author

Dufort, Benoit ; Roberts, Gordon W.

Author_Institution

Microelectron. & Comput. Syst. Lab., McGill Univ., Montreal, Que., Canada

Volume

34

Issue

3

fYear

1999

fDate

3/1/1999 12:00:00 AM

Firstpage

318

Lastpage

330

Abstract

A new method for generating analog signals with very low complexity and hardware requirements has recently been introduced. It consists of periodically reproducing short optimized bitstreams recorded from the output of a sigma-delta modulator. In this paper, various types of signals generated using the bitstream approach are discussed. Two different silicon implementations are presented, and their performance is analyzed through experimental results. Various ways in which the generators can be used are also demonstrated. Emphasis is placed on the simplicity of the design process and its compact implementation, which are crucial considerations when implementing a built-in self-test strategy

Keywords

integrated circuit testing; mixed analogue-digital integrated circuits; sequences; shift registers; sigma-delta modulation; signal generators; silicon; Si; Si implementations; built-in self-test strategy; compact implementation; mixed-signal BIST; on-chip analog signal generation; optimized bitstreams; sigma-delta modulator output; Automatic testing; Built-in self-test; Circuit synthesis; Circuit testing; Filters; Hardware; Oscillators; Signal generators; Signal synthesis; Silicon;

fLanguage

English

Journal_Title

Solid-State Circuits, IEEE Journal of

Publisher

ieee

ISSN

0018-9200

Type

jour

DOI

10.1109/4.748183

Filename

748183