• DocumentCode
    1477058
  • Title

    An activity-driven encoding scheme for power optimization in microprogrammed control unit

  • Author

    Wang, Chuan-Yu ; Roy, Kaushik

  • Author_Institution
    Synopsys Inc., Mountain View, CA, USA
  • Volume
    7
  • Issue
    1
  • fYear
    1999
  • fDate
    3/1/1999 12:00:00 AM
  • Firstpage
    130
  • Lastpage
    134
  • Abstract
    With the high demand for reliability and further integration, power consumption has become a critical concern in today´s very large scale integration design. Considering the different techniques to minimize power consumption and promote system´s reliability, reducing switching activity of CMOS circuits is a promising area to be explored. In this paper, we present a encoding scheme to refine the control memory in a microprogrammed control unit, which can reduce switching activities within the control unit and on the path from control unit to data-processing unit. To achieve this, pseudo-Boolean programming techniques have been introduced to efficiently encode don´t care bits in the control memory. Experiments have been conducted with a subset of 8086 instruction set. Results show that, 4.8%-16.5% reduction of switching activities can be obtained from the proposed encoding scheme.
  • Keywords
    CMOS digital integrated circuits; VLSI; circuit optimisation; encoding; integrated circuit design; low-power electronics; microcontrollers; microprogramming; programmable circuits; 8086 instruction set; CMOS circuit; VLSI design; control memory; data processing unit; encoding; microprogrammed control unit; power consumption; power optimization; pseudo-Boolean programming; reliability; switching activity; CMOS logic circuits; Capacitance; Computer architecture; Encoding; Energy consumption; Integrated circuit reliability; Logic gates; Power system reliability; Switching circuits; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/92.748210
  • Filename
    748210