DocumentCode
1477595
Title
Influence of film thickness on the critical current of YBa2 Cu3O7-x thick films on Ni-V biaxially textured substrates
Author
Boffa, V. ; Celentano, G. ; Ciontea, L. ; Fabbri, F. ; Galluzzi, V. ; Gambardella, U. ; Grimaldi, G. ; Mancini, A. ; Petrisor, T.
Author_Institution
Pirelli Cavi & Sistemi SpA, Milan, Italy
Volume
11
Issue
1
fYear
2001
fDate
3/1/2001 12:00:00 AM
Firstpage
3158
Lastpage
3161
Abstract
A promising approach to improve the engineering current density of coated conductors is to increase the thickness of the YBa2Cu 3O7-x (YBCO) layer. In this framework, a study regarding the relationship between the thickness of the superconducting film and its critical current was performed on biaxially aligned YBCO films grown on epitaxial Ce2O/NiO structure using Ni89 V11 non-magnetic substrate. The critical current density (JC) was measured for a series of YBCO films with thickness ranging from 0.2 to 2 μm, deposited at constant rate. JC values up to 6.4×105 A/cm2 at 77 K and zero magnetic field were obtained for thinner films decreasing three orders of magnitude for the 2 μm thick YBCO film. X-ray diffraction and morphological analyses indicate a progressive structural deterioration with the increase of film thickness
Keywords
X-ray diffraction; barium compounds; cerium compounds; critical current density (superconductivity); crystal morphology; high-temperature superconductors; nickel alloys; nickel compounds; superconducting thin films; vanadium alloys; yttrium compounds; 0.2 to 2 mum; 77 K; JC; Ni-V; Ni-V biaxially textured substrates; Ni89V11 nonmagnetic substrate; X-ray diffraction; YBCO; YBa2Cu3O7-x thick films; YBa2Cu3O7-Ce2 O-NiO-NiV; coated conductors; critical current; critical current density; engineering current density; epitaxial Ce2O/NiO structure; film thickness; morphological analyses; structural deterioration; superconducting film; thickness; zero magnetic field; Conductors; Critical current; Critical current density; Current density; Density measurement; Magnetic field measurement; Magnetic films; Substrates; Superconducting films; Yttrium barium copper oxide;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/77.919733
Filename
919733
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