Title :
Effects of local variations in critical current density on the performance of long Bi-2223 tapes
Author :
Fee, M. ; Fleshier, S. ; Otto, A. ; Malozemoff, A.P.
Author_Institution :
Ind. Res. Ltd., Lower Hutt, New Zealand
fDate :
3/1/2001 12:00:00 AM
Abstract :
A vital requirement for commercial application of Bi-2223 tapes is that the high critical current densities currently obtainable in short or intermediate lengths can be maintained when piece-lengths are scaled up by more than an order of magnitude. In this paper the effects of statistical variations in local I-V characteristics on the critical current of long superconducting tapes are investigated computationally. The local I-V characteristic is parameterized by the standard power law parameters Ic and index n. Analytic solutions and simulated data are presented for a number of statistical distributions in local I-V parameters, including Gaussian, Weibull and polynomial distributions. The study concludes that for typical parameters, given local statistical variations in Ic, there should be no significant loss in performance as tape lengths are scaled up by factors of 10 to 100
Keywords :
bismuth compounds; calcium compounds; critical current density (superconductivity); high-temperature superconductors; statistical analysis; strontium compounds; superconducting tapes; BiSrCaCuO; Gaussian distributions; HTSC; Weibull distributions; critical current density; local I-V characteristic; local statistical variations; long Bi-2223 tapes; long superconducting tapes; performance; polynomial distributions; standard power law parameters; statistical distributions; statistical variations; tape lengths; Analytical models; Computational modeling; Critical current; Critical current density; Performance loss; Polynomials; Probability distribution; Statistical distributions; Superconducting films; Voltage;
Journal_Title :
Applied Superconductivity, IEEE Transactions on