DocumentCode :
1478036
Title :
Barrier inhomogeneities and electrical characteristics of Ti/4H-SiC Schottky rectifiers
Author :
Defives, Dominique ; Noblanc, Olivier ; Dua, C. ; Brylinski, Christian ; Barthula, Marc ; Aubry-Fortuna, V. ; Meyer, Françoise
Author_Institution :
Lab. Central de Recherches, Thomson-CSF, Orsay, France
Volume :
46
Issue :
3
fYear :
1999
fDate :
3/1/1999 12:00:00 AM
Firstpage :
449
Lastpage :
455
Abstract :
Forward density-voltage (J-V) measurements of titanium/4H-SiC Schottky rectifiers are presented in a large temperature range. While some of the devices present a behavior in accordance with the thermionic current theory, others present an excess forward current at low voltage level. This anomaly appears more or less depending on the rectifier and on the temperature. A model based on two parallel Schottky rectifiers with different barrier heights is presented. The characteristics show good agreement. It is shown that the excess current at low voltage can be explained by a lowering of the Schottky barrier in localized regions. A proposal for the physical origin of these low barrier height areas is given
Keywords :
Schottky barriers; Schottky diodes; semiconductor device measurement; semiconductor device models; semiconductor materials; silicon compounds; solid-state rectifiers; titanium; Schottky rectifiers; Ti-SiC; barrier heights; barrier inhomogeneities; electrical characteristics; excess forward current; forward density-voltage measurements; localized regions; parallel Schottky rectifiers; temperature range; thermionic current theory; Annealing; Current density; Density measurement; Doping; Electric variables; Low voltage; Rectifiers; Schottky barriers; Silicon carbide; Titanium;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.748861
Filename :
748861
Link To Document :
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