Title :
Phenomenological model of the microwave surface impedance of high-T c superconducting films
Author :
Vendik, Irina B.
Author_Institution :
Dept. of Microelectron., Chalmers Univ. of Technol., Goteborg, Sweden
fDate :
3/1/2001 12:00:00 AM
Abstract :
The model of the microwave surface impedance of thin HTS films is based on a modified two-fluid approach and includes the phenomenological description of the normal and superconducting carrier density and the relaxation time of the normal carriers. A correlation between the London penetration depth at T=0 and the model parameter, which is responsible for the temperature dependence of the superconducting carrier density, was found from numerous experimental data. This correlation allows developing the phenomenological model of the HTS film surface impedance with minimal number of the fitting parameters: the transition temperature Tc, the normal conductivity at T=Tc, the residual resistance parameter, and the exponent describing the temperature dependence of the superconducting carrier density. The validity of the model was verified by a comparison with experimental data
Keywords :
carrier density; carrier relaxation time; high-frequency effects; high-temperature superconductors; penetration depth (superconductivity); superconducting thin films; superconducting transition temperature; surface conductivity; London penetration depth; Tc; exponent; fitting parameters; high-Tc superconducting films; microwave surface impedance; modified two-fluid approach; normal carrier density; phenomenological model; relaxation time; residual resistance parameter; superconducting carrier density; temperature dependence; thin HTS films; transition temperature; Charge carrier density; Conductive films; High temperature superconductors; Superconducting films; Superconducting microwave devices; Superconducting transition temperature; Surface fitting; Surface impedance; Surface resistance; Temperature dependence;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
