Title :
RMS digital trips offer increased accuracy and reliability advances in low-voltage circuit breaker trip technology
Author :
Purkayastha, Indrajit ; Savoie, Paul J.
Author_Institution :
General Electric Co., Plainville, CT, USA
Abstract :
With the growing use of static power converters and the subsequent increase in the harmonic content of power system current, low-voltage solid-state current-sensitive trip sensing techniques are becoming increasingly important. The function of low-voltage circuit breaker trip units and the need for direct root mean square (RMS) overcurrent sensing of the sinusoidal and nonsinusoidal current wave, including the percent error analysis, is reviewed
Keywords :
circuit breakers; overcurrent; reliability; LV circuit breakers; RMS digital trips; direct root mean square overcurrent; nonsinusoidal current wave; percent error analysis; reliability; sinusoidal current wave; solid-state current-sensitive trip sensing techniques; Circuit breakers; Conductors; Phase detection; Power system harmonics; Power system protection; Power system reliability; Rectifiers; Solid state circuits; Static power converters; Steady-state;
Journal_Title :
Industry Applications, IEEE Transactions on