Title :
Crosstalk and transient analyses of high-speed interconnects and packages
Author :
You, Hong ; Soma, Mani
Author_Institution :
Nat. Semicond. Corp., Santa Clara, CA, USA
fDate :
3/1/1991 12:00:00 AM
Abstract :
A multiconductor interconnect is modeled using resistors and linear-dependent current and voltage sources. The analysis of a high-speed circuit including lossy interconnection buses is then reduced to simulation of the circuit together with the equivalent circuits of the interconnects. The authors present a new method for the crosstalk and transient analysis of lossy interconnects with arbitrary termination circuits. In order to analyze an interconnect containing N signal conductors, they derive closed-form formulas to determine its transfer functions, and they apply the inverse Fourier transform to obtain its time-domain pulse response functions. Two types of equivalent circuit models can be formulated once the pulse response functions of the interconnect are found. The circuit schematics of the models depend on the number of the signal conductors, irrespective of the physical parameters of the interconnect. These models are compatible with standard circuit simulation tools since they consist of linear resistive networks and linear-dependent sources only. Two example circuits are studied to examine the accuracy and efficiency of the method
Keywords :
Fourier transforms; crosstalk; equivalent circuits; packaging; transients; arbitrary termination circuits; closed-form formulas; crosstalk; current sources; equivalent circuit models; equivalent circuits; high-speed interconnects; inverse Fourier transform; linear resistive networks; linear-dependent sources; lossy interconnection buses; multiconductor interconnect; physical parameters; pulse response functions; standard circuit simulation tools; time-domain pulse response functions; transfer functions; transient analyses; transient analysis; voltage sources; Analytical models; Circuit simulation; Conductors; Crosstalk; Equivalent circuits; Integrated circuit interconnections; Resistors; Signal analysis; Transient analysis; Voltage;
Journal_Title :
Solid-State Circuits, IEEE Journal of