DocumentCode :
1481438
Title :
Cryogenic sapphire oscillator using a low- vibration design pulse-tube cryocooler: first results
Author :
Hartnett, John G. ; Nand, Nitin R. ; Wang, Chao ; Le Floch, J.-M.
Author_Institution :
Sch. of Phys., Univ. of Western Australia, Crawley, WA, Australia
Volume :
57
Issue :
5
fYear :
2010
fDate :
5/1/2010 12:00:00 AM
Firstpage :
1034
Lastpage :
1038
Abstract :
A cryogenic sapphire oscillator (CSO) has been implemented at 11.2 GHz using a low-vibration design pulse-tube cryocooler. Compared with a state-of-the-art liquid helium cooled CSO in the same laboratory, the square root Allan variance of their combined fractional frequency instability is ??y = 1.4 ?? 10-5??-1/2 for integration times 1 < ?? < 10 s, dominated by white frequency noise. The minimum ??y = 5.3 ?? 10-16 for the two oscillators was reached at ?? = 20 s. Assuming equal contributions from both CSOs, the single oscillator phase noise S?? ?? -96 dB.rad2/Hz at 1 Hz set from the carrier.
Keywords :
cryogenic electronics; oscillators; cryogenic sapphire oscillator; fractional frequency instability; frequency 1 Hz; frequency 11.2 GHz; low-vibration design pulse-tube cryocooler; single oscillator phase noise; white frequency noise; Bellows; Copper; Counting circuits; Cryogenics; Frequency measurement; Microwave oscillators; Resonance; Resonant frequency; Temperature control;
fLanguage :
English
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-3010
Type :
jour
DOI :
10.1109/TUFFC.2010.1515
Filename :
5456252
Link To Document :
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