DocumentCode :
1483988
Title :
High-Responsivity and High-Speed Waveguide Photodiode With a Thin Absorption Region
Author :
Park, Jeong-Woo
Author_Institution :
Electron. & Telecommun. Res. Inst., Daejeon, South Korea
Volume :
22
Issue :
13
fYear :
2010
fDate :
7/1/2010 12:00:00 AM
Firstpage :
975
Lastpage :
977
Abstract :
The characteristics of a waveguide photodiode with a thin absorption layer are reported. A responsivity of 1.08 A/W at 1.55 μm was measured using a 0.1-μm -thick absorption region with a polarization dependence of less than 0.25 dB. A thin absorption layer enables us to use a thicker intrinsic layer. Using a thicker intrinsic region of 0.9 μm and an adiabatically reduced waveguide width, a bandwidth of 42 GHz was achieved. Adopting a tapering waveguide width did not give rise to a degradation of responsivity or alignment tolerance.
Keywords :
high-speed optical techniques; light absorption; light polarisation; optical waveguides; p-i-n photodiodes; photodetectors; adiabatically reduced waveguide width; alignment tolerance; bandwidth 42 GHz; high-responsivity waveguide photodiode; high-speed waveguide photodiode; polarization dependent absorption; size 0.1 mum; tapering waveguide width; thin absorption layer; wavelength 1.55 mum; Photodetector; photodiodes; waveguide photodiodes;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/LPT.2010.2048561
Filename :
5458094
Link To Document :
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