DocumentCode :
1485434
Title :
Selection of Optimal Software Reliability Growth Models Using a Distance Based Approach
Author :
Sharma, Kapil ; Garg, Rakesh ; Nagpal, C.K. ; Garg, R.K.
Author_Institution :
Guru Premsukh Memorial Coll. of Eng., Delhi, India
Volume :
59
Issue :
2
fYear :
2010
fDate :
6/1/2010 12:00:00 AM
Firstpage :
266
Lastpage :
276
Abstract :
A large number of software reliability growth models (SRGMs) have been proposed during the past 30 years to estimate software reliability measures such as the number of remaining faults, software failure rate, and software reliability. Selection of an optimal SRGM for use in a particular case has been an area of interest for researchers in the field of software reliability. Tools and techniques for software reliability model selection found in the literature cannot be used with high confidence as they use a limited number of model selection criteria. For the first time, we developed a deterministic quantitative model based on a distance based approach (DBA) method, then applied it for evaluation, optimal selection, and ranking of SRGMs. DBA recognizes the need for relative importance of criteria for a given application, without which inter-criterion comparison could not be accomplished. It requires a set of model selection criteria, along with a set of SRGMs, and their level of criteria for optimal selection; and it successfully presents the results in terms of a merit value which is used to rank the SRGMs. We use two distinct, real data sets for demonstration of the DBA method. The result of this study will be a ranking of SRGMs based on the Euclidean composite distance of each alternative to the designated optimal SRGM.
Keywords :
software reliability; Euclidean composite distance; deterministic quantitative model; distance based approach method; optimal software reliability growth models; Distance based approach; model ranking; model selection criteria; software reliability growth models;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.2010.2048657
Filename :
5460915
Link To Document :
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