• DocumentCode
    1486601
  • Title

    Effects of Curing and Chemical Aging on Warpage—Characterization and Simulation

  • Author

    Chiu, Tz-Cheng ; Che-Li Gung ; Huang, Hong-Wei ; Lai, Yi-Shao

  • Author_Institution
    Dept. of Mech. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
  • Volume
    11
  • Issue
    2
  • fYear
    2011
  • fDate
    6/1/2011 12:00:00 AM
  • Firstpage
    339
  • Lastpage
    348
  • Abstract
    In this paper, the effect of the curing process on the warpage of an encapsulated electronic package is considered by using a coupled chemical-thermomechanical modeling methodology. A cure-dependent constitutive model that consists of a cure-kinetic model, a curing- and chemical-aging-induced shrinkage model, and a degree of cure-dependent viscoelastic relaxation model was developed and implemented in a numerical finite-element model for warpage simulation. Effects of polymerization conversion and chemical aging on the warpage evolution of a bimaterial dummy package after molding and during the postmold curing (PMC) process were investigated by using the proposed modeling methodology. Shadow Moiré warpage analyses were also performed to validate the numerical results. It was found from the warpage analyses that the chemical aging, while contributing little to the overall cross linking during the PMC, has a significant effect on the package warpage. The coupled chemical-thermomechanical model can be applied for performing numerical optimization for the packaging process and the assembly reliability.
  • Keywords
    ageing; curing; electronics packaging; finite element analysis; moulding; polymerisation; shrinkage; Shadow Moiré warpage analyses; bimaterial dummy package; chemical aging; chemical-aging-induced shrinkage model; chemical-thermomechanical modeling methodology; cure-dependent constitutive model; cure-dependent viscoelastic relaxation model; cure-kinetic model; encapsulated electronic package; molding; numerical finite-element model; numerical optimization; polymerization conversion; postmold curing; warpage simulation; Aging; Chemicals; Compounds; Curing; Heating; Isothermal processes; Polymers; Chemical aging; cure; molding compound; viscoelasticity; warpage;
  • fLanguage
    English
  • Journal_Title
    Device and Materials Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1530-4388
  • Type

    jour

  • DOI
    10.1109/TDMR.2011.2135860
  • Filename
    5741714