DocumentCode
1486601
Title
Effects of Curing and Chemical Aging on Warpage—Characterization and Simulation
Author
Chiu, Tz-Cheng ; Che-Li Gung ; Huang, Hong-Wei ; Lai, Yi-Shao
Author_Institution
Dept. of Mech. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
Volume
11
Issue
2
fYear
2011
fDate
6/1/2011 12:00:00 AM
Firstpage
339
Lastpage
348
Abstract
In this paper, the effect of the curing process on the warpage of an encapsulated electronic package is considered by using a coupled chemical-thermomechanical modeling methodology. A cure-dependent constitutive model that consists of a cure-kinetic model, a curing- and chemical-aging-induced shrinkage model, and a degree of cure-dependent viscoelastic relaxation model was developed and implemented in a numerical finite-element model for warpage simulation. Effects of polymerization conversion and chemical aging on the warpage evolution of a bimaterial dummy package after molding and during the postmold curing (PMC) process were investigated by using the proposed modeling methodology. Shadow Moiré warpage analyses were also performed to validate the numerical results. It was found from the warpage analyses that the chemical aging, while contributing little to the overall cross linking during the PMC, has a significant effect on the package warpage. The coupled chemical-thermomechanical model can be applied for performing numerical optimization for the packaging process and the assembly reliability.
Keywords
ageing; curing; electronics packaging; finite element analysis; moulding; polymerisation; shrinkage; Shadow Moiré warpage analyses; bimaterial dummy package; chemical aging; chemical-aging-induced shrinkage model; chemical-thermomechanical modeling methodology; cure-dependent constitutive model; cure-dependent viscoelastic relaxation model; cure-kinetic model; encapsulated electronic package; molding; numerical finite-element model; numerical optimization; polymerization conversion; postmold curing; warpage simulation; Aging; Chemicals; Compounds; Curing; Heating; Isothermal processes; Polymers; Chemical aging; cure; molding compound; viscoelasticity; warpage;
fLanguage
English
Journal_Title
Device and Materials Reliability, IEEE Transactions on
Publisher
ieee
ISSN
1530-4388
Type
jour
DOI
10.1109/TDMR.2011.2135860
Filename
5741714
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