• DocumentCode
    1487167
  • Title

    Covariant-projection quadrilateral elements for the analysis of waveguides with sharp edges

  • Author

    Miniowitz, Ruth ; Webb, J.P.

  • Author_Institution
    Dept. of Electr. Eng., McGill Univ., Montreal, Que., Canada
  • Volume
    39
  • Issue
    3
  • fYear
    1991
  • fDate
    3/1/1991 12:00:00 AM
  • Firstpage
    501
  • Lastpage
    505
  • Abstract
    Covariant-projection elements are shown to be a good way of finding the dispersion characteristics of arbitrarily shaped waveguides. They have been demonstrated to produce no spurious modes, and because only tangential continuity is imposed between elements, either the electric field or the magnetic field may be calculated in the presence of dielectric and magnetic materials. Waveguides with sharp metal edges may be analyzed more efficiently than with other methods. Results are presented for a rectangular waveguide half loaded with dielectric, a double-ridged waveguide, a shielded microstrip line, and coupled microstrip lines on a cylindrical substrate. The matrices generated are sparse. and the number of zero eigenvalues produced is predictable. It therefore seems likely that the algebraic problem can be solved by sparse techniques, which would make the method applicable to even more complicated geometries at a modest computational cost
  • Keywords
    boundary-value problems; dispersion (wave); waveguide theory; BVP; coupled microstrip lines; cylindrical substrate; dispersion characteristics; double-ridged waveguide; electric field; magnetic field; rectangular waveguide; sharp metal edges; shielded microstrip line; sparse techniques; tangential continuity; zero eigenvalues; Dielectric substrates; Eigenvalues and eigenfunctions; Loaded waveguides; Magnetic analysis; Magnetic materials; Magnetic shielding; Microstrip; Rectangular waveguides; Sparse matrices; Transmission line matrix methods;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.75292
  • Filename
    75292