• DocumentCode
    1487696
  • Title

    A brief survey of radiation effects on polymer dielectrics

  • Author

    Laghari, Javaid R. ; Hammoud, Ahmad N.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., State Univ. of New York, Buffalo, NY, USA
  • Volume
    37
  • Issue
    2
  • fYear
    1990
  • fDate
    4/1/1990 12:00:00 AM
  • Firstpage
    1076
  • Lastpage
    1083
  • Abstract
    Future space power needs are extrapolated to be at least three to four orders of magnitude more than is currently available. This long-term reliable power will be required on missions such as the Space Station, Pathfinder, Space Plane, and high-powered satellites, and for national defense. Electrical insulation and dielectrics are the key electrical materials needed to support these power systems, where a single-point system failure could prove catastrophic or even fatal for the whole mission. Therefore, the impact of radiation, an environmental stress, on the properties and performance of insulation and dielectrics must be understood. The influence of radiation on polymer dielectrics, the insulating materials most commonly used for power transmission and storage, is reviewed. The effects of the type of radiation, dose, rate, and total exposure on the key electrical, mechanical, and physical properties of polymer dielectrics are described and explained.
  • Keywords
    density of solids; dielectric losses; elastic moduli; electric strength; electrical conductivity of amorphous semiconductors and insulators; insulation testing; organic insulating materials; permittivity; polymers; radiation effects; dose; electrical properties; mechanical properties; physical properties; polymer dielectrics; power transmission; radiation effects; Dielectric materials; Dielectrics and electrical insulation; Material storage; Polymers; Power system reliability; Radiation effects; Satellites; Space missions; Space stations; Stress;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.1990.574201
  • Filename
    574201