Title :
A Bayesian method for fitting parametric and nonparametric models to noisy data
Author :
Werman, Michael ; Keren, Daniel
Author_Institution :
Inst. of Comput. Sci., Hebrew Univ., Jerusalem, Israel
fDate :
5/1/2001 12:00:00 AM
Abstract :
We present a simple paradigm for fitting models, parametric and nonparametric, to noisy data, which resolves some of the problems associated with classical MSE algorithms. This is done by considering each point on the model as a possible source for each data point. The paradigm can be used to solve problems which are ill-posed in the classical MSE approach, such as fitting a segment (as opposed to a line). It is shown to be nonbiased and to achieve excellent results for general curves, even in the presence of strong discontinuities. Results are shown for a number of fitting problems, including lines, circles, elliptic arcs, segments, rectangles, and general curves, contaminated by Gaussian and uniform noise
Keywords :
Bayes methods; Gaussian noise; estimation theory; mean square error methods; probability; Bayesian method; circles; elliptic arcs; general curves; lines; model fitting; noisy data; nonparametric models; parametric models; rectangles; segments; strong discontinuities; uniform noise; Bayesian methods; Curve fitting; Gaussian noise; Image segmentation; Linear approximation; Mean square error methods; Parametric statistics; Polynomials; Surface fitting; Traveling salesman problems;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on