• DocumentCode
    148902
  • Title

    The fine pitch Cu-pillar bump interconnect technology utilizing NCP resin, achieving the high quality and reliability

  • Author

    Shimote, Yoshikazu ; Iwasaki, Takuya ; Watanabe, Manabu ; Baba, S. ; Kimura, Mizue

  • Author_Institution
    Renesas Electron. Corp., Kodaira, Japan
  • fYear
    2014
  • fDate
    23-25 April 2014
  • Firstpage
    608
  • Lastpage
    611
  • Abstract
    In the field of high-end server or network systems, the Flip Chip Ball Grid Array (FCBGA) package has been applied to achieve high performance on the device for data processing. And recently, global IT network and cloud markets, which require high-speed data processing, are rapidly expanding, so that further development of FCBGA package with high performance is strongly needed to realize such market demands. This time, we have developed Flip Chip technology with very fine pitch of 30 um staggered pitch Cu-pillar Bump, utilizing Non Conductive Paste (NCP) resin to adapt to high pin count device including high-speed signal interface. The keys of this flip chip technology are to optimize the condition of the reaction of NCP resin under the die and the phenomena of solder melting for interconnection. And, in order to confirm of the level of package reliability, the effectiveness of the height of solder joints was studied. The above technology and reliability is reported on this paper.
  • Keywords
    ball grid arrays; copper alloys; fine-pitch technology; flip-chip devices; integrated circuit interconnections; integrated circuit packaging; integrated circuit reliability; resins; Cu; FCBGA; NCP resin; cloud markets; fine pitch copper-pillar bump interconnect technology; flip chip ball grid array package; flip chip technology; global IT network; high pin count device; high-end server; high-speed data processing; high-speed signal interface; network systems; nonconductive paste resin; package reliability level; size 30 mum; solder melting; Bonding; Flip-chip devices; Heating; Reliability; Resins; Shape; Substrates; Cu-pillar Bump; Flip Chip Ball Grid Array Package; Flip Chip Bonding; High Reliability; Local Reflow; Non Conductive Paste;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging (ICEP), 2014 International Conference on
  • Conference_Location
    Toyama
  • Print_ISBN
    978-4-904090-10-7
  • Type

    conf

  • DOI
    10.1109/ICEP.2014.6826752
  • Filename
    6826752