Title :
Behavioral Modeling of IC Memories From Measured Data
Author :
Stievano, Igor S. ; Rigazio, Luca ; Canavero, Flavio G. ; Cunha, Telmo R. ; Pedro, José C. ; Teixeira, Hugo M. ; Girardi, Antonio ; Izzi, Roberto ; Vitale, Filippo
Author_Institution :
Dipt. di Elettron., Politec. di Torino, Torino, Italy
Abstract :
This paper addresses the generation of behavioral models of digital integrated circuits (ICs) for signal and power integrity simulations. The proposed models are obtained by external measurements carried out at the device ports only and by the combined application of specialized state-of-the-art modeling techniques. The present approach exploits a behavioral formulation, leading to models reproducing all the behavior of the IC ports as the input/output buffers and the core power delivery network. The modeling procedure is demonstrated for a commercial nor Flash memory in 90-nm technology housed by a specifically designed test fixture.
Keywords :
flash memories; integrated circuit modelling; integrated circuit testing; Flash memory; IC memory; IC ports; behavioral formulation; behavioral modeling; commercial memory; core power delivery network; device ports only; digital integrated circuits; external measurements; input buffers; measured data; modeling procedure; output buffers; power integrity simulations; signal integrity simulations; specialized state-of-the-art modeling techniques; test fixture; Computational modeling; Current measurement; Data models; Estimation; Integrated circuit modeling; Mathematical model; Circuit modeling; digital integrated circuits (ICs); input/output (I/O) ports; macromodeling; power delivery network; power integrity;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2011.2128570
