Title :
Utilizing a Risk-Based Systems Approach in the Due Diligence Process for Renewable Energy Generation
Author :
Wilson, Daniel M. ; Rowley, Paul N. ; Watson, Simon J.
Author_Institution :
Dept. of Electron. & Electr. Eng., Loughborough Univ., Loughborough, UK
fDate :
6/1/2011 12:00:00 AM
Abstract :
The commercial viability of a marine renewable energy technology is impacted by a range of holistic factors related not only to the performance of the generating device, but also the characteristics of the system-of-systems within which the device operates. In this work, an investment risk assessment methodology is presented that takes account of a wide range of whole-system parameters, and provides a bridge between a device-centric evidence base and the wider systems-level data that is required in order to effectively assess the case for a specific investment. Within the paper, a system modeling framework is presented, and a case study assessment is conducted to illustrate the application of the proposed approach. The results indicate that by considering a proposed scheme in terms of both its efficacy as an operating system, along with specific lifecycle factors from concept to disposal, risks and costs can be identified in a systematic and justifiable manner. In addition, technical factors can be described in terms of their effects on the primary capability of the system, namely to produce electricity at an economically feasible cost whilst maximizing return on investment.
Keywords :
Bayes methods; investment; power generation economics; renewable energy sources; risk management; device centric evidence; due diligence process; investment risk assessment methodology; lifecycle factor; marine renewable energy technology; renewable energy generation; risk based system; Bayesian methods; Biological system modeling; Electricity; Investments; Maintenance engineering; Renewable energy resources; Uncertainty; Marine energy; power generation economics; system modeling; systems engineering;
Journal_Title :
Systems Journal, IEEE
DOI :
10.1109/JSYST.2011.2125150