DocumentCode
1491933
Title
Test Technology TC Newsletter
Volume
27
Issue
3
fYear
2010
Firstpage
78
Lastpage
79
Abstract
This month´s Test Technology TC Newsletter features highlights of past events—11th IEEE Latin-American Test Workshop; Design, Automation and Test in Europe (DATE 2010)—and upcoming events: 3rd IEEE International Symposium on Hardware, and the 16th IEEE International Mixed-Signals, Sensors, and Systems Test Workshop.
Keywords
DATE 2010; HOST 2010; IMS3TW 2010; LATW 2010;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.2010.72
Filename
5465131
Link To Document