Title :
Signal-to-noise ratio in stretch processing
Author :
Long, Teng ; Wang, Yannan ; Zeng, Tao
Author_Institution :
Dept. of Electron. Eng., Beijing Inst. of Technol., Beijing, China
Abstract :
A comprehensive analysis of the signal-to-noise ratio (SNR) in stretch processing is presented. The key is to calculate the output noise power. Based on the spectral representation theory of stochastic process, a compact formula used to evaluate the noise power is derived and then the output SNR is obtained. Further discussions for different cases are carried out. The results provide a theoretical basis for the SNR analysis.
Keywords :
signal representation; spectral analysis; stochastic processes; SNR analysis; output noise power; signal-to-noise ratio; spectral representation theory; stochastic process; stretch processing;
Journal_Title :
Electronics Letters
DOI :
10.1049/el.2010.0349
